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KMID : 1102020190490010010
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Applied Microscopy
2019 Volume.49 No. 1 p.10 ~ p.10
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Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy
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Chang Yun-Yeong
Han Heung-Nam
Kim Mi-Young
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Abstract
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Two-dimensional materials such as transition metal dichalcogenide and graphene are of great interest due to their intriguing electronic and optical properties such as metal-insulator transition based on structural variation. Accordingly, detailed analyses of structural tunability with transmission electron microscopy have become increasingly important for understanding atomic configurations. This review presents a few analyses that can be applied to two-dimensional materials using transmission electron microscopy.
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KEYWORD
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Transmission electron microscopy, 2D materials, Transition metal dichalcogenide, Graphene, Van der Waals heterostructure
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